2007/10/31 演講者: Dr .Heh(SEMATECH ) 演講題目: Overview of Electrical Characterization and Reliability on MOSFET
公告張貼期間:2007-10-282007-10-28
公告者940105
內文:

本週邀請到 SEMATECH Dr .Heh 進行專題演講
題目:Overview of Electrical Characterization and Reliability on MOSFET
時間: 10/31 PM:3:20~5:00
地點: 工科館105

附檔和網址是 相關介紹
http://tech.digitimes.com.tw/ShowNews.aspx?zCatId=125&zNotesDocId=7B733376E4A1DB7D482570D80049BCD0

http://www.eettaiwan.com/ART_8800414553_480102_NT_4af23856.HTM

The short biography of Dr .Heh is shown below

Dawei Heh received his bachelor degree from the physics department in National Taiwan University in 1996. He then got his Master and Ph. D. from the department of electrical and computer engineering in University of Maryland in 2001 and 2005 respectively. He worked in the reliability group at National Institute of Standards and Technology (NIST) as a guest researcher when he was pursuing his Ph. D. degree. He is now working in the electrical characterization and reliability group at SEMATECH. His work includes the development of new technique and the characterization of high-k, non-volatile memory and high-speed channel devices


歡迎各位同學踴躍參與
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